Displacement current measurement of MIS devices with ionic liquids to explore carrier behaviors in model interfaces of organic devices

Taiki Yamada, Yutaka Noguchi, Yukio Ouchi, Hisao Ishii

研究成果: Conference contribution査読

抄録

Charge injection property of organic thin film devices is a key issue to understand the device operation. Displacement current measurement (DCM) is a powerful technique to probe the charge injection behaviors in terms of a change in the apparent capacitance of test devices. However, it requires to suppress actual current flowing through the device for investigating the details of interface phenomena. We propose here the use of ionic liquids (ILs) as a top contact insulator in organic metal-insulator-semiconductor (MIS) structures. Because of the high stability and dielectric constant of the ILs, the external applied voltage was applied mainly to the organic layer with suppressing the actual current. The DCM curves of Pt wire/IL/α-NPD/ITO structure were measured, and they actually show the signals due to the hole injection from the ITO to α-NPD layer and accumulation at the IL/α-NPD.

本文言語English
ホスト出版物のタイトルMolecular and Hybrid Materials for Electronics and Photonics
ページ43-48
ページ数6
DOI
出版ステータスPublished - 2011
イベント2010 MRS Fall Meeting - Boston, MA, United States
継続期間: 29 11月 20103 12月 2010

出版物シリーズ

名前Materials Research Society Symposium Proceedings
1286
ISSN(印刷版)0272-9172

Conference

Conference2010 MRS Fall Meeting
国/地域United States
CityBoston, MA
Period29/11/103/12/10

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