A method for diagnosing resistive open faults with considering adjacent lines

Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume

研究成果: Conference contribution

6 被引用数 (Scopus)

抄録

It is believed that resistive open faults can cause small delay defects at wires, contacts, and/or vias of a circuit. However, it remains to be elucidated whether any methods could diagnose resistive open faults. We propose a method for diagnosing resistive open faults by using a diagnostic delay fault simulation with the minimum detectable delay fault size. We also introduce a fault excitation function for the resistive open fault to improve the accuracy of the diagnostic result. The fault excitation function for the resistive open fault can determine a size of an additional delay at a faulty line with considering the effect of the adjacent lines. We demonstrated that the proposed method is capable of identifying fault locations for the resistive open fault with a small computation cost.

本文言語English
ホスト出版物のタイトルISCIT 2010 - 2010 10th International Symposium on Communications and Information Technologies
ページ609-614
ページ数6
DOI
出版ステータスPublished - 1 12 2010
イベント2010 10th International Symposium on Communications and Information Technologies, ISCIT 2010 - Tokyo, Japan
継続期間: 26 10 201029 10 2010

出版物シリーズ

名前ISCIT 2010 - 2010 10th International Symposium on Communications and Information Technologies

Conference

Conference2010 10th International Symposium on Communications and Information Technologies, ISCIT 2010
CountryJapan
CityTokyo
Period26/10/1029/10/10

フィンガープリント 「A method for diagnosing resistive open faults with considering adjacent lines」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル