A diagnostic fault simulation method for a single universal logical fault model

Toshinori Hosokawa, Hideyuki Takano, Hiroshi Yamazaki, Koji Yamazaki

研究成果: Conference contribution

3 被引用数 (Scopus)

抄録

Fault diagnosis methods for specified fault models might deduce wrong faults as suspicious candidate faults (misprediction). The methods might not be able to also deduce suspicious candidate faults (non-prediction). In this paper, a fault diagnosis method for a single universal logical fault model in scan testing is proposed. In the fault diagnosis method, a diagnostic fault simulation for a single universal logical fault model is used. The number of mispredictions, the number of non-predictions, the number of suspicious candidate faults, and fault diagnosis time are evaluated compared with a fault diagnosis method for a single stuck-at fault model. Experimental results show the effectiveness of our proposed method.

本文言語English
ホスト出版物のタイトルProceedings - 2017 IEEE 22nd Pacific Rim International Symposium on Dependable Computing, PRDC 2017
編集者Masato Kitakami, Dong Seong Kim, Vijay Varadharajan
出版社IEEE Computer Society
ページ217-218
ページ数2
ISBN(電子版)9781509056514
DOI
出版ステータスPublished - 5 5 2017
イベント22nd IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2017 - Christchurch, New Zealand
継続期間: 22 1 201725 1 2017

出版物シリーズ

名前Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC
ISSN(印刷版)1541-0110

Conference

Conference22nd IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2017
CountryNew Zealand
CityChristchurch
Period22/01/1725/01/17

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