Time-of-flight measurement as a tool to investigate the hole blocking nature of an operating organic light-emitting diode

Md Mijanur Rahman, Naoki Ogawa, Yutaka Noguchi, Hisao Ishii, Yasuo Nakayama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

For better understanding the operation of organic electronic devices, the information of carrier behavior is indispensable. In this study, we propose a new usage of time-off-light (TOF) technique to examine the carrier behavior in operating device. From the measurement for ITO|α-NPD|Alq3|Al device, which is a widely investigated organic light emitting diode, we have demonstrated the feasibility of TOF measurement for double-layer device in operating condition. The obtained TOF signal includes two kinds of useful information: (i) carrier transporting nature under the influence of actual current flow and (ii) delayed-transport and blocking of carriers at hetero interface.

Original languageEnglish
Title of host publication2012 International Conference on Informatics, Electronics and Vision, ICIEV 2012
Pages342-346
Number of pages5
DOIs
Publication statusPublished - 26 Nov 2012
Event2012 1st International Conference on Informatics, Electronics and Vision, ICIEV 2012 - Dhaka, Bangladesh
Duration: 18 May 201219 May 2012

Publication series

Name2012 International Conference on Informatics, Electronics and Vision, ICIEV 2012

Conference

Conference2012 1st International Conference on Informatics, Electronics and Vision, ICIEV 2012
CountryBangladesh
CityDhaka
Period18/05/1219/05/12

Keywords

  • carrier behavior
  • hole blocking
  • organic light emitting diode
  • time of flight

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    Rahman, M. M., Ogawa, N., Noguchi, Y., Ishii, H., & Nakayama, Y. (2012). Time-of-flight measurement as a tool to investigate the hole blocking nature of an operating organic light-emitting diode. In 2012 International Conference on Informatics, Electronics and Vision, ICIEV 2012 (pp. 342-346). [6317499] (2012 International Conference on Informatics, Electronics and Vision, ICIEV 2012). https://doi.org/10.1109/ICIEV.2012.6317499