Time-of-flight measurement as a tool to investigate the hole blocking nature of an operating organic light-emitting diode

Md Mijanur Rahman, Naoki Ogawa, Yutaka Noguchi, Hisao Ishii, Yasuo Nakayama

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

For better understanding the operation of organic electronic devices, the information of carrier behavior is indispensable. In this study, we propose a new usage of time-off-light (TOF) technique to examine the carrier behavior in operating device. From the measurement for ITO|α-NPD|Alq3|Al device, which is a widely investigated organic light emitting diode, we have demonstrated the feasibility of TOF measurement for double-layer device in operating condition. The obtained TOF signal includes two kinds of useful information: (i) carrier transporting nature under the influence of actual current flow and (ii) delayed-transport and blocking of carriers at hetero interface.

Original languageEnglish
Title of host publication2012 International Conference on Informatics, Electronics and Vision, ICIEV 2012
Pages342-346
Number of pages5
DOIs
Publication statusPublished - 26 Nov 2012
Event2012 1st International Conference on Informatics, Electronics and Vision, ICIEV 2012 - Dhaka, Bangladesh
Duration: 18 May 201219 May 2012

Publication series

Name2012 International Conference on Informatics, Electronics and Vision, ICIEV 2012

Conference

Conference2012 1st International Conference on Informatics, Electronics and Vision, ICIEV 2012
Country/TerritoryBangladesh
CityDhaka
Period18/05/1219/05/12

Keywords

  • carrier behavior
  • hole blocking
  • organic light emitting diode
  • time of flight

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