May the fourth (terminal) be with you - Circuit design beyond FinFet

Hanpei Koike, Shin Ichi O'uchi, Masakazu Hioki, Kazuhiko Endo, Takashi Matsukawa, Yongxun Liu, Meishoku Masahara, Toshiyuki Tsutsumi, Kunihiro Sakamoto, Tadashi Nakagawa, Toshihiro Sekigawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2010 IEEE International Electron Devices Meeting, IEDM 2010
DOIs
Publication statusPublished - 1 Dec 2010
Event2010 IEEE International Electron Devices Meeting, IEDM 2010 - San Francisco, CA, United States
Duration: 6 Dec 20108 Dec 2010

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
ISSN (Print)0163-1918

Conference

Conference2010 IEEE International Electron Devices Meeting, IEDM 2010
CountryUnited States
CitySan Francisco, CA
Period6/12/108/12/10

Cite this

Koike, H., O'uchi, S. I., Hioki, M., Endo, K., Matsukawa, T., Liu, Y., ... Sekigawa, T. (2010). May the fourth (terminal) be with you - Circuit design beyond FinFet. In 2010 IEEE International Electron Devices Meeting, IEDM 2010 [5703381] (Technical Digest - International Electron Devices Meeting, IEDM). https://doi.org/10.1109/IEDM.2010.5703381