Machine Learning for Automated Etch Pit Counting on As-sliced Surface of Multicrystalline Silicon

Takuto Kojima, Kohei Onishi, Atsushi Ogura, Kenji Fukui, Manabu Komoda, Junichi Atobe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Automated counting of etch pits in non-mirror multicrystalline silicon substrate is attempted using pattern recognition with machine learning. Combined with pre-processing with denoising and morphological filters, highly accurate segmentation into etch pit and background with small training data for supervised machine learning. The morphological variation of etch pits and slice marks which is derived from difference in crystal orientation of each grain causes overfitting of the trained classifier to each image. It reduces versatility of the trained classifier.

Original languageEnglish
Title of host publication2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages347-349
Number of pages3
ISBN (Electronic)9781538685297
DOIs
Publication statusPublished - 26 Nov 2018
Event7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States
Duration: 10 Jun 201815 Jun 2018

Publication series

Name2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

Conference

Conference7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
CountryUnited States
CityWaikoloa Village
Period10/06/1815/06/18

Keywords

  • achine learning
  • image analysis
  • silicon

Cite this

Kojima, T., Onishi, K., Ogura, A., Fukui, K., Komoda, M., & Atobe, J. (2018). Machine Learning for Automated Etch Pit Counting on As-sliced Surface of Multicrystalline Silicon. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC (pp. 347-349). [8547392] (2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2018.8547392