Fanout-based fault diagnosis for open faults on pass/fail information

Koji Yamazaki, Yuzo Takamatsu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

With the increasing of circuit density, the importance of locating open faults becomes larger. In recent years, built-in self test (BIST) is widely used to reduce test cost. Therefore, development of efficient fault diagnosis approach under BIST environment is much wanted. In this paper, we propose fanout-based fault diagnosis approach for open faults on pass/fail information. Experimental results for ISCAS'85 and ITC'99 benchmark circuits show that the number of candidate faults becomes less than 2 at most cases by using error path tracing and multiple stuck-at fault simulator.

Original languageEnglish
Title of host publicationProceedings of the 15th Asian Test Symposium 2006
Pages349-353
Number of pages5
DOIs
Publication statusPublished - 1 Dec 2006
Event15th Asian Test Symposium 2006 - Fukuoka, Japan
Duration: 20 Nov 200623 Nov 2006

Publication series

NameProceedings of the Asian Test Symposium
Volume2006
ISSN (Print)1081-7735

Conference

Conference15th Asian Test Symposium 2006
CountryJapan
CityFukuoka
Period20/11/0623/11/06

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  • Cite this

    Yamazaki, K., & Takamatsu, Y. (2006). Fanout-based fault diagnosis for open faults on pass/fail information. In Proceedings of the 15th Asian Test Symposium 2006 (pp. 349-353). [4030790] (Proceedings of the Asian Test Symposium; Vol. 2006). https://doi.org/10.1109/ATS.2006.260954