A method for diagnosing resistive open faults with considering adjacent lines

Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

It is believed that resistive open faults can cause small delay defects at wires, contacts, and/or vias of a circuit. However, it remains to be elucidated whether any methods could diagnose resistive open faults. We propose a method for diagnosing resistive open faults by using a diagnostic delay fault simulation with the minimum detectable delay fault size. We also introduce a fault excitation function for the resistive open fault to improve the accuracy of the diagnostic result. The fault excitation function for the resistive open fault can determine a size of an additional delay at a faulty line with considering the effect of the adjacent lines. We demonstrated that the proposed method is capable of identifying fault locations for the resistive open fault with a small computation cost.

Original languageEnglish
Title of host publicationISCIT 2010 - 2010 10th International Symposium on Communications and Information Technologies
Pages609-614
Number of pages6
DOIs
Publication statusPublished - 1 Dec 2010
Event2010 10th International Symposium on Communications and Information Technologies, ISCIT 2010 - Tokyo, Japan
Duration: 26 Oct 201029 Oct 2010

Publication series

NameISCIT 2010 - 2010 10th International Symposium on Communications and Information Technologies

Conference

Conference2010 10th International Symposium on Communications and Information Technologies, ISCIT 2010
CountryJapan
CityTokyo
Period26/10/1029/10/10

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Keywords

  • Fault diagnosis
  • Open fault
  • Testing

Cite this

Takahashi, H., Higami, Y., Takamatsu, Y., Yamazaki, K., Tsutsumi, T., Yotsuyanagi, H., & Hashizume, M. (2010). A method for diagnosing resistive open faults with considering adjacent lines. In ISCIT 2010 - 2010 10th International Symposium on Communications and Information Technologies (pp. 609-614). [5665061] (ISCIT 2010 - 2010 10th International Symposium on Communications and Information Technologies). https://doi.org/10.1109/ISCIT.2010.5665061