Ryo Yokogawa

  • 47 Citations
  • 4 h-Index
20142020

Research output per year

If you made any changes in Pure these will be visible here soon.

Personal profile

Personal profile

to be determined

Fingerprint Dive into the research topics where Ryo Yokogawa is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 6 Similar Profiles

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output

  • 47 Citations
  • 4 h-Index
  • 13 Article
  • 9 Conference contribution
  • 1 Conference article
  • Stress evaluation induced by wiggling silicon nitride fine pattern using Raman spectroscopy

    Koharada, M., Yokogawa, R., Sawamoto, N., Yoshioka, K. & Ogura, A., 1 Jun 2020, In : Japanese Journal of Applied Physics. 59, SI, SIIF03.

    Research output: Contribution to journalArticle

  • Anisotropic biaxial strain evaluation in carbon-doped silicon using water-immersion Raman spectroscopy

    Yoshioka, K., Yokogawa, R., Sawamoto, N. & Ogura, A., 1 Jan 2019, Semiconductor Process Integration 11. Murota, J., Claeys, C., Iwai, H., Tao, M., Deleonibus, S., Mai, A., Shiojima, K. & Cao, Y. (eds.). 4 ed. Electrochemical Society Inc., p. 33-39 7 p. (ECS Transactions; vol. 92, no. 4).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Evaluation of thermal conductivity characteristics in Si nanowire covered with oxide by UV Raman spectroscopy

    Yokogawa, R., Tomita, M., Watanabe, T. & Ogura, A., 1 Jan 2019, In : Japanese Journal of Applied Physics. 58, SD, SDDF04.

    Research output: Contribution to journalArticle

    Open Access
  • Evaluations of minority carrier lifetime in floating zone Si affected by Si insulated gate bipolar transistor processes

    Kobayashi, H., Yokogawa, R., Kinoshita, K., Numasawa, Y., Ogura, A., Nishizawa, S. I., Saraya, T., Ito, K., Takakura, T., Suzuki, S. I., Fukui, M., Takeuchi, K. & Hiramoto, T., 1 Jan 2019, In : Japanese Journal of Applied Physics. 58, 59, SBBD07.

    Research output: Contribution to journalArticle

    Open Access